P203 P203-可靠性与热管理技术

中方主持人:

外方主持人:

分会场地:北京首都机场希尔顿酒店二层会议室28
时间安排:11-02 08:30 - 12:00

可靠性与热管理技术一直是制约LED照明高品质的重要因素,如今对于可靠性的关注点已经从LED单个产品向整个系统可靠性的方向发展。在这一过程中新型散热材料、热管理技术、LED照明系统可靠性研究及设计、故障数据与失效分析、制造过程中的控制及可靠性筛选、寿命加速老化测试方法、失效模式与仿真模拟等技术的进步等都影响整个系统的可靠性。

SSLCHINA: P203-可靠性与热管理技术/ Technologies for Reliability and Thermal Management

时间:2017年11月2日上午 8:30~12:00

场地:北京首都机场希尔顿酒店Ÿ二层会议室28

Time: Nov 2nd, 2017 8:30~12:00am

Location: Hilton Beijing Capital Airport, Beijing Ÿ2nd Floor MR28

主持

Moderator

赵丽霞/ZHAO Lixia

中国科学院半导体研究所研究员,中国科学院大学岗位教授 /Professor at Semiconductor Institute of Chinese Academy of Sciences , University of Chinese Academy of Sciences

Gordon ELGER

德国英戈尔施塔特应用技术大学教授/Professor at University of Applied Science Ingolstadt (Technische Hochschule Ingolstadt), Germany

08:30-08:55

Chip Scale Package LED Modules: Reliability and Thermal Management

Elger GORDON    德国英戈尔施塔特应用技术大学教授

Elger GORDON    Professor at University of Applied Science Ingolstadt, Germany

08:55-09:20

Thermal Characterization of Multi-Chip Light Emitting Diodes with Thermal Resistance Matrix

李世玮    香港科技大学教授

Shi-Wei.Ricky LEE    Professor at Hong Kong University of Science and Technology

09:20-09:40

Failure Analysis Case Studies on LED Chip

方方    广东金鉴检测科技有限公司总经理

FANG Fang    General Manager of GMATG Inc.

09:40-10:05

Influence of Optical Power Calculation on LED Thermal Resistance Test

郭伟玲    北京工业大学光电子技术省部共建教育部重点实验室教授

GUO Weiling    Professor at Beijing university of technology, optoelectronics technology Lab. Ministry of Education

10:05-10:20

茶歇/Tea Break

10:20-10:45

Analytic Approaches for Device-Reliability Characteristics in GaN-Based Light-Emitting Diodes

Ja-soon JANG    韩国岭南大学教授

Ja-soon JANG    Professor at Yeungnam University, Korea

10:45-11:05

Reliability and Lifetime Prediction of LEDs Drivers

ZHANG Hui    纽约州立大学奥斯威戈分校助理教授

ZHANG Hui    Assistant Professor at State University of New York at Oswego, USA

11:05-11:25

Analysis of the Quality Of Sinter Interfaces of LEDs with New Transient Thermal Analysis Test Equipment

Schmid MAXIMILIAN    德国英戈尔施塔特应用技术大学

Schmid MAXIMILIAN    University of Applied Science Ingolstadt, Germany

11:25-11:50

Reliability and Failure Analysis for GaN-based LEDs

赵丽霞    中国科学院半导体研究所研究员,中国科学院大学岗位教授

ZHAO Lixia    Professor at Semiconductor Institute of Chinese Academy of Sciences, Professor at University of Chinese Academy of Sciences

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